The gene expression response of yeast to various types of stresses/perturbations shows a common pattern for the vast majority of genes, characterized by a quick transient peak followed by a return to the basal level (adaptation). In order to model this transient and the consequent adaptation, we use the idea of integral feedback (the integral representing the relative concentration of gene products). The resulting linear system with input explain sufficiently well the different time constants observable in the transient response while, at the same time, being in agreement with the known experimental degradation rates measurements.

Modeling the genome-wide transient response to stimuli in yeast: adaptation through integral feedback / Zampieri, M.; Soranzano, N.; Altafini, C.. - (2009), pp. 167-172. (Intervento presentato al convegno 47th IEEE Conference on Decision and Control tenutosi a Cancun, Messico nel 11-14 Dicembre 2008) [10.1109/CDC.2008.4739180].

Modeling the genome-wide transient response to stimuli in yeast: adaptation through integral feedback

Altafini, C.
2009-01-01

Abstract

The gene expression response of yeast to various types of stresses/perturbations shows a common pattern for the vast majority of genes, characterized by a quick transient peak followed by a return to the basal level (adaptation). In order to model this transient and the consequent adaptation, we use the idea of integral feedback (the integral representing the relative concentration of gene products). The resulting linear system with input explain sufficiently well the different time constants observable in the transient response while, at the same time, being in agreement with the known experimental degradation rates measurements.
2009
2008 47th IEEE Conference on Decision and Control
167
172
9781424431243
IEEE
Zampieri, M.; Soranzano, N.; Altafini, C.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11767/30622
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